SKU:19906351635
Force Modulation AFM Probes
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USA
- USA
- CAN
- USA
- CAN
Ships within 48 hours · Estimated delivery Jul 16 - Jul 21
Description
Force Modulation AFM ProbesMulti75 G Force Modulation AFM Probe AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 m (15 19 m)* Setback: 15 m (10 20 m)* Radius: < 10 nm Half Cone Angle: 20 25 along cantilever axis, 25 30 from side, 10 at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 3 N m (1 7 N m)* Resonance Frequency: 75 kHz (60 90 kHz)* Length: 225 m (215 235 m)* Width: 28 m (23 33 m)* Thickness: 3 m (2 4 m)* * typical range Coating Uncoated
The stub offers extra material to modify and connect non-standard vacuum connections
Dimensions with hinges and clasp: 210 x 178 x 32mm (8
and quality paper backing
Medium (12961)
Vacuum Release (VR) Sample Kit - Large Die
Maximum temperature for normal embedding processes: 80°C (176°F)
Tip Size 2mm #27203-20 smooth
Film thickness: 50nm ultra low stress Si3N4 on both sides
20° 13678C 23M Micro-Scale
High quality glass
AS - Clear Anti-Static plastic (optimum visibility)
9" (123mm)
Quick Dispatch:
Your Force Modulation AFM Probes orders ship within 1-2 business days.
Delivery Options:
- Standard: 3-7 business days
- Fast: 2-3 business days
- Express: 1-2 business days
Order Tracking:
You'll receive a tracking link by email once your Force Modulation AFM Probes ships.
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Exchange/Return Notes
- We offer a 30-day return/exchange service after receiving.
- Final sale items are not eligible for returns or exchanges.
- To process your return/exchange, please contact us at [email protected]
- Please click here for more details>>> Return & Exchange Policy